Multi-function Scanning Electron Microscopy System Angstrom AA8000

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    Brand: Angstrom / Model: AA8000

    Angstrom Advanced AA8000 is a true multi-purpose, multi-user Scanning Electron Microscope(SEM). It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. The AA8000 Scanning Electron Microscope features a perfect balance between stable configuration and an excellent resolution. The AA8000 Scanning Electron Microscope has state-of-art SEM technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom AA8000 SEM pursues compact SEM design which is great for office environment. Angstrom AA8000 SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.

    Specifications

    High Performance

                   Field proven image quality

                   Upgraded scan speed and pixel resolution.

                   Wide variety of optional instrument

                   Resolution : 3.0 nm

                   Magnification : ~1,000,000X

                   Display : Photo 4096X 4096

                   Search : 640X480 30fps

                   Options : BSE / WDS / EDS / EBSD / Etc.

    Gun Coumn

                   Gun design for stable current supply

                   Dual field objective lens for spherical

                   Aberration reduction

                   Movable aperture for beam centering

                   Upgraded design of magnetic lens (CL/OL)

    Chamber & Stage

                   5 axis eucentric stage

                   Option: Stage motorization

                   EDS,WDS,CCD, Manipulator etc

                   50X60X57mm

    Detector

                   ET-bar type SE detector

                   SE & BSE double image mode

                   Option: BSE detector

    GUI

                   Window based GUI

                   PC controlled operation

                   Image thumbnail & storage

                   Parameter Display

    Specifications

    Z ELECTRON OPTIC SYSTEM

    Resolution

    3.0 nm @30KeV SE/ 4.0nm @BSE

     Magnification

    10 ~ 1,000,000X

    Image

    Color Optical Microscope Image (Option)

    Beam Scan Mode

    Search, Inspection, Photo (3step)

    Accelerating Voltage

    0.5kV~30kV

    Electron Gun Type

    Tungsten Filament

    Bias System

    Linked with Acc. Voltage plus continuous voltage control

    Gun Alignment

    Pre-centered cartridge

    Condenser Lens

    Electromagnetic 2 stages

    Objective Lens

    Electromagnetic 1 stages

    Stigmator

    8 Pole Electromagnetic Type

    Detector

    Bar Type SE Detector (SE-BSE Conversion Mode Without BSE detector for Non-coating sample inspection)

    Image Shift

    4 Pole Electromagnetic Type

    Automation Function

    Auto-Focus, Auto-Stigmatism, Auto Contrast/Brightness, Emission Current etc.

     

    DISPLAY

    Frame Memory &Scan

    Search (640X480) >30 frame/s

    Inspection (1280X960)  30 frame/s

    Photo(4096X4096)  2 frame/s

     

    IMAGE ANALYZER

    Image Analyzer Particle Counter

    Multi-Focusing/ Image Tiling/ 3D-View/Enhancement/ Color Transformation/Filters/ Blob Analysis (Single/Multiple/Grouping), Histogram, Excel Data, Point Measurement

     

    STAGE SYSTEM

    Movement (X/Y/Z) mm

    60/70/65mm

    Tilt

    -20~60° (Max 90 °)

    Rotation

    360°

    Stage Motorization

    X,Y,R (Standard) X,Y,Z,Tilt,Rotation (Option)

     

    VACUUM SYSTEM

    Vacuum Control Type

    Full automation with safety system

    Vacuum System

    Rotary Pump + Diffusion Pump or Rotary Pump + Turbo Pump (Option)

     

    CONTROL SYSTEM

    Computer System

    Intel Pentium 4(Dual Co-Processor)

    Memory

    ≥ 256MB, Control Data Interface

    Operation System

    Image Acquisition